jueves, marzo 08, 2012

Metrología Industrial Dimensional

METROMEET 2012 Bilbao, 8ª Conferencia Internacional sobre Metrología Industrial Dimensional, es la conferencia más importante en el sector de la Metrología industrial, se celebra los días 8 y 9 de marzo de 2012 en el Palacio Euskalduna, Bilbao, Bizkaia.


PROGRAMA DE PONENCIAS DEL EVENTO METROMEET 2012
  • The digital metrology workflow, a new paradigm for the knowledge based manufacturing
  • Nano-metrology; Accuracy of interferometric measurements
  • 3D and metrology in an unusual and very challenging environment: the In Vessel Viewing System (IVVS) of ITER
  • A new Concept for High-Speed atline and inlineCT for up to 100% Mass Production Process Control
  • Intelligent Camshaft Manufacturing Systems. Dimensional Quality Control in the Factory Line
  • Metrological solutions for diffractive optics manufacturing
  • How accurate are Computed Tomography dimensional measurements?
  • Metrology in Micro System Technologies
  • Minimising the cost of measurement in manufacturing
  • Advanced point cloud information management for inline quality control
  • Magneto-Optical Measurement techniques for Magnetic Materials Metrology
  • 3D capability for nanopositioning and nanometrology

  • A two-dimensional moving platform with nanometer resolution to increase the measuring range of AFMs
  • Large Machine tool 5 DOF Verification
  • Measurement uncertainty associated with coordinate measurements: evaluation and reduction

  • The future of Metrological Software
  • Using measurement and software to optimise part setup for machining
  • Nanotechnology Roadmap

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